System-on-Chip Test Architectures
  • Author : Laung-Terng Wang
  • Release Date : 28 July 2010
  • Publisher : Morgan Kaufmann
  • Genre : Technology & Engineering
  • Pages : 896
  • ISBN 13 : 0080556809

System-on-Chip Test Architectures Book Summary

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

System on Chip Test Architectures

System on Chip Test Architectures

Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Genre : Technology & Engineering
Total View : 3958 Views
File Size : 44,5 Mb
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically ...

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Author : Erik Larsson
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 4035 Views
File Size : 43,5 Mb
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three ...

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Publisher : IGI Global
Genre : Computers
Total View : 3189 Views
File Size : 42,6 Mb
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"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--...

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Publisher : IET
Genre : Computers
Total View : 8292 Views
File Size : 41,7 Mb
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System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum ...

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Publisher : Springer
Genre : Computers
Total View : 5813 Views
File Size : 47,7 Mb
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This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of ...

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Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 1884 Views
File Size : 42,7 Mb
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System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation ...

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Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 4827 Views
File Size : 41,9 Mb
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community ...

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Author : Ricardo Reis,Vincent Mooney,Paul Hasler
Publisher : Springer
Genre : Computers
Total View : 7328 Views
File Size : 49,9 Mb
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This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15...