Scanning Nonlinear Dielectric Microscopy
  • Author : Yasuo Cho
  • Release Date : 20 May 2020
  • Publisher : Woodhead Publishing
  • Genre : Technology & Engineering
  • Pages : 256
  • ISBN 13 : 9780081028032

Scanning Nonlinear Dielectric Microscopy Book Summary

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Author : Yasuo Cho
Publisher : Woodhead Publishing
Genre : Technology & Engineering
Total View : 9097 Views
File Size : 52,9 Mb
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric ...

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Author : Yasuo Cho
Publisher : Woodhead Publishing
Genre : Technology & Engineering
Total View : 2495 Views
File Size : 46,8 Mb
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric ...

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials

Author : Marin Alexe,Alexei Gruverman
Publisher : Springer Science & Business Media
Genre : Science
Total View : 5062 Views
File Size : 40,8 Mb
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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, ...

Scanning Probe Microscopy  Characterization  Nanofabrication and Device Application of Functional Materials

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Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publisher : Springer Science & Business Media
Genre : Science
Total View : 6960 Views
File Size : 52,5 Mb
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is ...

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy

Author : Seizo Morita
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 5739 Views
File Size : 41,9 Mb
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Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well ...

Innovative Graphene Technologies

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Author : Atul Tiwari
Publisher : Smithers Rapra
Genre : Science
Total View : 2379 Views
File Size : 44,5 Mb
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Graphene has already gained a unique reputation among novel synthetic materials. Dedicated efforts and enormous resources are being invested in creating viable commercial products. The high electrical and thermal conductivities in graphene are well known, and most of the applications of this material are pivoted to these properties. In addition ...

Applied Scanning Probe Methods X

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Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 2538 Views
File Size : 47,5 Mb
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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 ...

Polar Oxides

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Author : Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publisher : John Wiley & Sons
Genre : Technology & Engineering
Total View : 1497 Views
File Size : 54,6 Mb
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Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical ...