Quantitative Data Processing in Scanning Probe Microscopy
  • Author : Petr Klapetek
  • Release Date : 24 January 2018
  • Publisher : Micro & Nano Technologies
  • Genre : Uncategorized
  • Pages : 416
  • ISBN 13 : 0128133473

Quantitative Data Processing in Scanning Probe Microscopy Book Summary

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http: //gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy

Author : Petr Klapetek
Publisher : Micro & Nano Technologies
Genre : Uncategorized
Total View : 6120 Views
File Size : 50,6 Mb
Get Book

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this ...

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy

Author : Petr Klapetek
Publisher : Elsevier
Genre : Science
Total View : 549 Views
File Size : 46,8 Mb
Get Book

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this ...

Atomic Force Microscopy

Atomic Force Microscopy

Author : Bert Voigtländer
Publisher : Springer
Genre : Science
Total View : 6892 Views
File Size : 47,8 Mb
Get Book

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part ...

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy

Author : Francesco Marinello,Daniele Passeri,Enrico Savio
Publisher : Springer Science & Business Media
Genre : Science
Total View : 9113 Views
File Size : 46,5 Mb
Get Book

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including ...

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy

Author : Francesco Marinello,Daniele Passeri,Enrico Savio
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 5133 Views
File Size : 40,5 Mb
Get Book

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including ...

Applied Scanning Probe Methods II

Applied Scanning Probe Methods II

Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Genre : Technology & Engineering
Total View : 6360 Views
File Size : 49,6 Mb
Get Book

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- ...

Scanning Probe Microscopy

Scanning Probe Microscopy

Author : Ernst Meyer,Hans Josef Hug,Roland Bennewitz
Publisher : Springer Science & Business Media
Genre : Science
Total View : 8924 Views
File Size : 50,8 Mb
Get Book

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe ...

Microbeam Analysis

Microbeam Analysis

Author : John J. Friel
Publisher : Vch Pub
Genre : Science
Total View : 2185 Views
File Size : 42,6 Mb
Get Book

...